Scanning Probe Microscopy (SPM)
for research and education
FSM Nanoview-1000/2000:
the cheapest high resolution AFM
Features
- Spring-suspended head offers a strong anti-vibration performance
- Precision laser detection and probe alignment device make laser adjustment simple and easy
- Scan by sample
- High-accuracy and wide range sample positioning
- Top view optical microscope for laser alignement and sample positioning.
- Scanners: standard 20×20 um; optional 10×10 um , 50×50 um , 100×100 um
- Resolution: Lateral 0.2 nm , Vertical 0.05 nm
- Images: 512×512 px
- Optical magnification : standard 4X, resolution 2.5 um; optional 10X or 20X
- Standard modes: Contact, Tapping; optional modes : Phase, EFM, MFM, LFM
- Scan speed: 0.6Hz – 4 Hz
- Scan direction: any angle
- Max sample dimensions: φ<90 mm H<20 mm
- Operating system : Windows XP/7/8/10
